ZEISS and EMBL brought together 160 researchers in Heidelberg to discuss newest trends and applications in 3D correlative microscopy
In March, ZEISS & EMBL brought together 160 researchers in Heidelberg to discuss the newest applications in correlative microscopy. The goal of the #EMBL3D symposium was not only to provide an update on the latest development in the field but also to connect people from diverse fields of research. Experts and new-to-the-field alike had the opportunity to share their experience and their views on the current methods and tools, but also exchange about the future challenges of these emerging techniques.
The symposium gathered leading experts in the field of 3D correlative light and electron microscopy, with a particular focus on automated serial imaging by scanning electron microscopy. Keynote talks by Winfried Denk (Max Planck Institute of Neurobiology, Germany) and Fred Hamprecht (Interdisciplinary Center for Scientific Computing (IWR) and Department of Physics and Astronomy, Heidelberg, Germany) covered the latest breakthroughs in automated serial imaging and 3D image analysis. Invited session chairs included Chris Guerin (VIB Ghent, Belgium), Graham Knott (EPFL Lausanne, Switzerland), Anna Kreshuk (IWR and Heidelberg Collaboratory for Image Processing (HCI), University of Heidelberg, Germany), Peter O’Toole (University of York, United Kingdom), and Richard Webb (University of Queensland, Australia) with Welcome Remarks by Jan Ellenberg (EMBL Heidelberg, Germany) and Markus Weber (Member of the Management Board, Carl Zeiss Microscopy GmbH, Germany). Various lectures from invited guests and practical workshops addressed a large spectrum of topics related to 3D CLEM, from state-of-the-art methods to most recent biological applications.
Together with our partners from SelectScience we are proud to host a special web page that offers not only video interviews with participants and recordings of lectures but also a host of additional materials and knowledge from the world of correlative microscopy.
Our special thanks go to our scientific & conference organizers: YOU made it visible! Yannick Schwab & Nicole Schieber & Diah Yulianti (EMBL Heidelberg, Germany), Chris Guerin & Saskia Lippens (VIB Ghent, Belgium), Robert Kirmse & Hans-Jürgen Oberdiek (Carl Zeiss Microscopy GmbH, Germany).
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