ZEISS Demonstrates Cutting-Edge Research with Ion Beam Technology

June 27, 2016 ZEISS Microscopy

Researchers highlighted capabilities of unique Helium Ion Microscope for nanofabrication at first North America Helium Ion Microscopy User Meeting

ZEISS announces that it recently held the first North America Helium Ion Microscopy User Meeting, bringing together researchers from all across the US and beyond, at the ZEISS Ion Microscopy Innovation Center (IMIC) in Peabody, MA. The meeting featured presentations highlighting some of the cutting-edge work being done with ZEISS ORION and ORION NanoFab, which are the only noble gas ion microscopes available on the market today. Additionally, experts from ZEISS presented and provided users with a factory tour. Attendees included both current and prospective users of ZEISS ORION technology.

Impression from the 2016 ORION user meeting at ZEISS in Peabody

“Our goal with this meeting was to bring together the community of users of our helium ion microscope systems, giving everyone an opportunity to network with one another and share inspiration about current and future use of this innovative technology,” said Bernhard Goetze, Director of Product Management for ZEISS.

Tungsten needle, grown on a gold sphere. Image courtesy of Frances Allen, University of California, Berkeley.
Tungsten needle, grown on a gold sphere. Image courtesy of Frances Allen, University of California, Berkeley.

Scientists from Universities, National Labs, and more presented on nanofabrication research performed with ZEISS ORION microscopes. Among the research presented were projects focusing on: helium-ion milled solid-state nanopore technology, to be used for the creation of smaller and faster DNA sequencing devices; focused helium ion beam modification of high-TC superconductors and magnetic materials, to be used for military and biomedical applications; and Secondary Ion Mass Spectrometry (SIMS), high-resolution, high-sensitivity nano-analytics performed with helium ion microscope technology.

Experts from ZEISS also presented at the meeting, describing exciting future applications of helium ion beam microscopy that are in the focus of development for future product generations. In addition, a feedback session with researchers brought valuable insights from all attendees with further suggestions for future development of ZEISS ORION technology. The accompanying image contest, where users were invited to share an image taken with their microscope system that best displayed the technology’s capabilities, was won by Dr. Frances Allen of the University of California, Berkeley, with an image of a tungsten needle deposited on top of a nanoscale gold sphere.

ZEISS ORION NanoFab

ZEISS ORION NanoFab is a 3-in-1 multi-beam ion microscope for fast and precise fabrication of sub-10nm nanostructures, featuring gallium, neon and helium ion beans. The neon beam allows users to machine nanostructures at great speed and achieve high throughput, while the helium beam allows for the creation of delicate, sub-10 nm structures. The optional gallium FIB can be used to remove massive material.

More details are available on our product website!

Read the recent publication featuring various applications with ZEISS ORION technology!

The post ZEISS Demonstrates Cutting-Edge Research with Ion Beam Technology appeared first on Microscopy News Blog.

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