ZEISS impresses at EMC2016 with Crossbeam FIB-SEM technology and correlative microscopy solutions
The 16th European Microscopy Congress, EMC2016 gathered around 2500 visitors from 51 countries all over the world in Lyon, France. Along with an international and multidisciplinary high quality conference, EMC2016 hosted Europe’s largest exhibition dedicated to microscopy. The congress also offered a large number of training and scientific activities underlining the dynamism of French and European research.
Special highlights were the ZEISS Lunch&Learn sessions about correlative microscopy with Atlas 5 and nanofabrication with high-throughput FIB-SEM technology, presented by our specialists and invited guest speaker Marco Cantoni, EPFL, Lausanne, Switzerland. EMC2016 visitors had the chance to attend live demonstrations of ZEISS Crossbeam 540 with our experts and discuss their applications.
If you attented the event, we would like to say a big “Thank you” for contributing to this success. We hope you enjoyed the ZEISS talks, workshops and events, and had great discussions with our experts at the ZEISS booth. The next edition of EMC will take place in 2020 in Copenhagen: Looking forward to meeting you there!