ZEISS Sigma: Your FE-SEMs for High Quality Imaging and Advanced Analytical Microscopy

April 10, 2015
Combine field emission SEM (FE-SEM) technology with advanced analytics. Profit from proven Gemini electron optics. Choose from a variety of detector options: you can image particles, surfaces, and nanostructures. Save time with Sigma’s semi-automated 4-step workflow: structure your imaging and analysis routines and increase productivity. http://www.zeiss.com/sigma
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Digital Classroom with ZEISS Microscopes
Digital Classroom with ZEISS Microscopes

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ZEISS GeminiSEM: Your FE-SEMs for High Contrast, Low Voltage Images
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