ZEISS presents an update of LabDCT – its diffraction contrast tomography module for the ZEISS Xradia 520 Versa X-ray microscope. This imaging and analytical technique is used to obtain crystallographic information on metal alloys or polycrystalline materials. It enables non-destructive mapping of orientation and microstructure. With LabDCT, ZEISS takes diffraction contrast tomography out of the exclusive realm of the synchrotron and extends it right into the researcher’s laboratory. LabDCT includes GrainMapper3D analysis software developed by Xnovo Technology ApS.
With the update of LabDCT, users can now combine 3D grain orientation with 3D microstructural features such as defects or precipitates observed in tomography. This opens up new possibilities for characterizing damage, deformation and growth mechanisms or even modeling for predictive materials design. Researchers can now complete grain imaging with 3D grain morphology. They routinely acquire grain statistics on larger volumes at faster acquisition times. Crystallographic information provided by LabDCT lets users supplement other analyses like EBSD or synchrotron methods.
Nik Chawla, Arizona State University professor of materials science and engineering, and the director of the Center for 4D Materials Science (4DMS), says, “3D X-ray provides a new dimension to studying metallic alloys. With our ZEISS Xradia Versa system and LabDCT, we can do cutting edge-experiments in-house. The 24/7 access reduces the long wait times between synchrotron trips, while allowing us to perform long-term uninterrupted studies on corrosion and crack growth.”
Download the tech note here to learn more.
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