ZEISS Crossbeam 550 receives German Design Award 2018

October 30, 2017 ZEISS Microscopy

A jury of experts from the German Design Council has voted the ZEISS Crossbeam 550 focused ion beam scanning electron microscope (FIB-SEM) as a winner of the German Design Award 2018 in the “Material and Surfaces” category.

High-end applications in research and industry

Users of this FIB-SEM investigate nanostructures such as composites, metals, biomaterials or semiconductors with analytical and imaging methods in parallel. ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput, e.g. for cross-sectioning, TEM lamella preparation or nano-patterning. The instrument provides best image quality in 2D and 3D.

The premium prize of the German Design Council

The German Design Award is the top international prize of the German Design Council. Its goal: to discover, present and honor unique design trends. Therefore, every year, top-quality entries from product and communication design are rewarded, all of which are in their own way ground-breaking in the international design landscape. Launched in 2012, the German Design Award is one of the most well-respected design competitions in the world and is held in high regard well beyond professional circles.

The German Design Award is conferred by the German Design Council, Germany’s leading brand and design authority. Its mission is to present the latest developments on the German design scene.

More information on ZEISS Crossbeam 550

The post ZEISS Crossbeam 550 receives German Design Award 2018 appeared first on Microscopy News Blog.

Previous Article
New generation of ZEISS EVO scanning electron microscope introduced
New generation of ZEISS EVO scanning electron microscope introduced

Modular platform for intuitive operation, routine investigations and research applications ZEISS presents t...

Next Article
ZEISS introduces update of LabDCT diffraction contrast tomography module for X-ray microscopy
ZEISS introduces update of LabDCT diffraction contrast tomography module for X-ray microscopy

ZEISS presents an update of LabDCT – its diffraction contrast tomography module for the ZEISS Xradia 520 Ve...